Data Sheet AD5761R/AD5721R
Rev. C | Page 23 of 36
TERMINOLOGY
Total Unadjusted Error (TUE)
Total unadjusted error is a measure of the output error taking
all the various errors into account, namely INL error, offset
error, gain error, and output drift over supplies, temperature,
and time. TUE is expressed in % FSR.
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy, or integral nonlinearity, is a
measure of the maximum deviation, in LSB, from a straight line
passing through the endpoints of the DAC transfer function.
A typical INL error vs. DAC code plot is shown in Figure 7.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent codes.
A specified differential nonlinearity of ±1 LSB maximum ensures
monotonicity. The AD5761R/AD5721R are guaranteed monotonic.
A typical DNL error vs. code plot is shown in Figure 11.
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input code. The AD5761R/AD5721R
are monotonic over their full operating temperature range.
Bipolar Zero Error
Bipolar zero error is the deviation of the analog output from the
ideal half-scale output of 0 V when the DAC register is loaded
with 0x8000 (straight binary coding) or 0x0000 (twos complement
coding) for the AD5761R/AD5721R.
Bipolar Zero Temperature Coefficient (TC)
Bipolar zero TC is a measure of the change in the bipolar zero
error with a change in temperature. It is expressed in µV/°C.
Zero-Scale Error
Zero-scale error is the error in the DAC output voltage when
0x0000 (straight binary coding) or 0x8000 (twos complement
coding) is loaded to the DAC register. Ideally, the output voltage
is negative full scale. A plot of zero-scale error vs. temperature is
shown in Figure 21.
Zero-Scale Error Temperature Coefficient (TC)
Zero-scale error TC is a measure of the change in zero-scale
error with a change in temperature. It is expressed in µV/°C.
Offset Error
Offset error is a measure of the difference between VOUT (actual)
and VOUT (ideal) expressed in mV in the linear region of the
transfer function.
Offset Error Temperature Coefficient (TC)
Offset error TC is a measurement of the change in offset error
with a change in temperature. It is expressed in µV/°C.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal expressed in % FSR. A plot of gain error vs. temperature is
shown in Figure 24.
Gain Error Temperature Coefficient (TC)
Gain error TC is a measure of the change in gain error with
changes in temperature. It is expressed in ppm FSR/°C.
DC Power Supply Rejection Ratio (DC PSRR)
DC power supply rejection ratio is a measure of the rejection of
the output voltage to dc changes in the power supplies applied
to the DAC. It is measured for a given dc change in power
supply voltage and is expressed in mV / V.
AC Power Supply Rejection Ratio (AC PSRR)
AC power supply rejection ratio is a measure of the rejection of
the output voltage to ac changes in the power supplies applied
to the DAC. It is measured for a given amplitude and frequency
change in power supply voltage and is expressed in decibels.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for
the output to settle to a specified level for a full-scale input
change. Full-scale settling time is shown in Figure 48 to Figure 51.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec
and is measured when the digital input code is changed by 1 LSB at
the major carry transition (see Figure 56 and Figure 57).
Glitch Impulse Peak Amplitude
Glitch impulse peak amplitude is the peak amplitude of the
impulse injected into the analog output when the input code in
the DAC register changes state. It is specified as the amplitude
of the glitch in mV and is measured when the digital input code
is changed by 1 LSB at the major carry transition.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC but is measured when the DAC output is not updated. It is
specified in nV-sec and measured with a full-scale code change
on the data bus.
Noise Spectral Density (NSD)
Noise spectral density is a measurement of the internally
generated random noise characterized as a spectral density
(nV/√Hz). It is measured by loading the DAC to full scale and
measuring noise at the output. It is measured in nV/√Hz. A plot
of noise spectral density is shown in Figure 69.