REV. A
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may result from its use. No license is granted by implication or otherwise
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Tel: 781/329-4700 www.analog.com
Fax: 781/326-8703 © 2003 Analog Devices, Inc. All rights reserved.
ADF4106
PLL Frequency Synthesizer
FEATURES
6.0 GHz Bandwidth
2.7 V to 3.3 V Power Supply
Separate Charge Pump Supply (VP) Allows Extended
Tuning Voltage in 3 V Systems
Programmable Dual-Modulus Prescaler
8/9, 16/17, 32/33, 64/65
Programmable Charge Pump Currents
Programmable Antibacklash Pulsewidth
3-Wire Serial Interface
Analog and Digital Lock Detect
Hardware and Software Power-Down Modes
APPLICATIONS
Broadband Wireless Access
Instrumentation
Wireless LANs
Base Stations for Wireless Radio
FUNCTIONAL BLOCK DIAGRAM
14-BIT
R COUNTER
R COUNTER
LATCH
FUNCTION
LATCH
AB COUNTER
LATCH
24-BIT INPUT
REGISTER 22
14
REF
IN
CLK
DATA
LE
AV
DD
DV
DD
PHASE
FREQUENCY
DETECTOR
CHARGE
PUMP
REFERENCE
V
P
CPGND R
SET
CURRENT
SETTING 2
CURRENT
SETTING 1
CPI3 CPI2 CPI1 CPI6 CPI5 CPI4
LOCK
DETECT
CP
MUXOUT
AV
DD
SD
OUT
HIGH Z
19
13-BIT
B COUNTER
PRESCALER
P/P + 1
RF
IN
A
RF
IN
B
6-BIT
A COUNTER
FROM
FUNCTION
LATCH
LOAD
LOAD
M3 M2 M1
MUX
6
N = BP + A
CE AGND DGND
ADF4106
13
GENERAL DESCRIPTION
The ADF4106 frequency synthesizer can be used to implement
local oscillators in the upconversion and downconversion sections
of wireless receivers and transmitters. It consists of a low noise
digital PFD (phase frequency detector), a precision charge pump,
a programmable reference divider, programmable A and B
counters, and a dual-modulus prescaler (P/P + 1). The A (6-bit)
and B (13-bit) counters, in conjunction with the dual-modulus
prescaler (P/P + 1), implement an N divider (N = BP + A). In
addition, the 14-bit reference counter (R counter) allows selectable
REF
IN
frequencies at the PFD input. A complete PLL (phase-
locked loop) can be implemented if the synthesizer is used with
an external loop filter and VCO (voltage controlled oscillator).
Its very high bandwidth means that frequency doublers can be
eliminated in many high frequency systems, simplifying system
architecture and lowering cost.
REV. A–2–
ADF4106–SPECIFICATIONS
1
(AVDD = DVDD = 3 V 10%; AVDD VP 5.5 V; AGND = DGND = CPGND = 0 V;
RSET = 5.1 k; dBm referred to 50 ; TA = TMIN to TMAX, unless otherwise noted.)
BChips
2
Parameter B Version
1
(Typ) Unit Test Conditions/Comments
RF CHARACTERISTICS See Figure 3 for Input Circuit
RF Input Frequency (RF
IN
)
3
0.5/6.0 0.5/6.0 GHz min/max
RF Input Sensitivity 10/0 10/0 dBm min/max
Maximum Allowable
Prescaler Output Frequency
4
300 300 MHz max
REF
IN
CHARACTERISTICS
REF
IN
Input Frequency 20/250 20/250 MHz min/max For f < 20 MHz, Use DC-Coupled
Square Wave (0 to V
DD
)
REF
IN
Input Sensitivity
5
0.8/AV
DD
0.8/AV
DD
V p-p min/max AC-Coupled; When DC-Coupled,
0 to V
DD
max (CMOS Compatible)
REF
IN
Input Capacitance 10 10 pF max
REF
IN
Input Current ±100 ±100 µA max
PHASE DETECTOR
Phase Detector Frequency
6
56 56 MHz max
CHARGE PUMP
I
CP
Sink/Source Programmable, See Table V
High Value 5 5 mA typ With R
SET
= 5.1 k
Low Value 625 625 µA typ
Absolute Accuracy 2.5 2.5 % typ With R
SET
= 5.1 k
R
SET
Range 2.7/10 2.7/10 k typ See Table V
I
CP
Three-State Leakage Current 1 1 nA typ
Sink and Source Current Matching 2 2 % typ 0.5 V V
CP
V
P
0.5 V
I
CP
vs. V
CP
1.5 1.5 % typ 0.5 V V
CP
V
P
0.5 V
I
CP
vs. Temperature 2 2 % typ V
CP
= V
P
/2
LOGIC INPUTS
V
INH
, Input High Voltage 1.4 1.4 V min
V
INL
, Input Low Voltage 0.6 0.6 V max
I
INH
/I
INL
, Input Current ±1±1µA max
C
IN
, Input Capacitance 10 10 pF max
LOGIC OUTPUTS
V
OH
, Output High Voltage 1.4 1.4 V min Open-Drain Output Chosen 1 k
Pull-up to 1.8 V
V
OH
, Output High Voltage V
DD
0.4 V
DD
0.4 V min CMOS Output Chosen
I
OH
100 100 µA max
V
OL
, Output Low Voltage 0.4 0.4 V max I
OL
= 500 µA
POWER SUPPLIES
AV
DD
2.7/3.3 2.7/3.3 V min/V max
DV
DD
AV
DD
AV
DD
V
P
AV
DD
/5.5 AV
DD
/5.5 V min/V max AV
DD
V
P
5.5 V
I
DD7
(AI
DD
+ DI
DD
)1513mA max 13 mA typ
I
P
0.4 0.4 mA max T
A
= 25°C
Power-Down Mode
8
(AI
DD
+ DI
DD
)10 10 µA typ
REV. A
ADF4106
–3–
BChips
2
Parameter B Version
1
(Typ) Unit Test Conditions/Comments
NOISE CHARACTERISTICS
ADF4106 Phase Noise Floor
9
174 174 dBc/Hz typ @ 25 kHz PFD Frequency
166 166 dBc/Hz typ @ 200 kHz PFD Frequency
159 159 dBc/Hz typ @ 1 MHz PFD Frequency
Phase Noise Performance
10
@ VCO Output
900 MHz Output
11
93 93 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
5800 MHz Output
12
74 74 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
5800 MHz Output
13
84 84 dBc/Hz typ @ 1 kHz Offset and 1 MHz PFD Frequency
Spurious Signals
900 MHz Output
11
90/92 90/92 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
5800 MHz Output
12
65/70 65/70 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
5800 MHz Output
13
70/75 70/75 dBc typ @ 1 MHz/2 MHz and 1 MHz PFD Frequency
NOTES
1
Operating temperature range (B Version) is 40°C to +85°C.
2
The BChip specifications are given as typical values.
3
Use a square wave for lower frequencies, below the mimimum stated.
4
The maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency
that is less than this value.
5
AV
DD
= DV
DD
= 3 V.
6
Guaranteed by design. Sample tested to ensure compliance.
7
T
A
= 25°C; AV
DD
= DV
DD
= 3 V; P = 16; RF
IN
= 6.0 GHz.
8
T
A
= 25°C; AV
DD
= DV
DD
= 3.3 V; R = 16383; A = 63; B = 891; P = 32; RF
IN
= 6.0 GHz.
9
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20logN (where N is the N divider value).
10
The phase noise is measured with the EVAL-ADF4106EB1 evaluation board and the HP8562E spectrum analyzer. The spectrum analyzer provides the REF
IN
for
the synthesizer (f
REFOUT
= 10 MHz @ 0 dBm).
11
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; Offset Frequency = 1 kHz; f
RF
= 900 MHz; N = 4500; Loop B/W = 20 kHz.
12
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; Offset Frequency = 1 kHz; f
RF
= 5800 MHz; N = 29000; Loop B/W = 20 kHz.
13
f
REFIN
= 10 MHz; f
PFD
= 1 MHz; Offset Frequency = 1 kHz; f
RF
= 5800 MHz; N = 5800; Loop B/W = 100 kHz.
Specifications subject to change without notice.
TIMING CHARACTERISTICS
(AVDD = DVDD = 3 V 10%; AVDD VP 5.5 V; AGND = DGND = CPGND = 0 V; RSET = 5.1 k;
TA = TMIN to TMAX, unless otherwise noted.)
Limit at
T
MIN
to T
MAX
Parameter (B Version) Unit Test Conditions/Comments
t
1
10 ns min DATA to CLOCK Setup Time
t
2
10 ns min DATA to CLOCK Hold Time
t
3
25 ns min CLOCK High Duration
t
4
25 ns min CLOCK Low Duration
t
5
10 ns min CLOCK to LE Setup Time
t
6
20 ns min LE Pulsewidth
NOTES
Guaranteed by design but not production tested.
Specifications subject to change without notice.
CLOCK
DB23 (MSB) DB22 DB2 DB1 (CONTROL
BIT C2)
t
5
DATA
LE
DB0 (LSB)
(CONTROL BIT C1)
t
6
t
1
t
2
t
3
t
4
LE
Figure 1. Timing Diagram
REV. A–4–
ADF4106
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
ADF4106 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS
1, 2
(T
A
= 25°C, unless otherwise noted.)
AV
DD
to GND
3
. . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +3.6 V
AV
DD
to DV
DD
. . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +0.3 V
V
P
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +5.8 V
V
P
to AV
DD
. . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +5.8 V
Digital I/O Voltage to GND . . . . . . . . 0.3 V to V
DD
+ 0.3 V
Analog I/O Voltage to GND . . . . . . . . . . 0.3 V to V
P
+ 0.3 V
REF
IN
, RF
IN
A, RF
IN
B to GND . . . . . . 0.3 V to V
DD
+ 0.3 V
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . 40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . 65°C to +150°C
Maximum Junction Temperature . . . . . . . . . . . . . . . . . 150°C
TSSOP
JA
Thermal Impedance . . . . . . . . . . . . . . 150.4°C/W
ORDERING GUIDE
Model Temperature Range Package Option*
ADF4106BRU 40°C to +85°CRU-16
ADF4106BRU-REEL 40°C to +85°CRU-16
ADF4106BRU-REEL7 40°C to +85°CRU-16
ADF4106BCP 40°C to +85°CCP-20
ADF4106BCP-REEL 40°C to +85°CCP-20
ADF4106BCP-REEL7 40°C to +85°CCP-20
EVAL-ADF4106EB1
*RU = Thin Shrink Small Outline Package (TSSOP).
CP = Lead Frame Chip Scale Package (LFCSP).
Contact the factory for chip availability.
Note that aluminum bond wire should not be used with the ADF4106 die.
LFCSP
JA
Thermal Impedance . . . . . . . . . . . . . . . . 122°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . . 215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
This device is a high performance RF integrated circuit with an ESD rating of
<2 kV, and it is ESD sensitive. Proper precautions should be taken for handling
and assembly.
3
GND = AGND = DGND = 0 V.
REV. A
ADF4106
–5–
PIN CONFIGURATIONS
TSSOP
TOP VIEW
(Not to Scale)
R
SET
CP
CPGND
AGND
RF
IN
B
RF
IN
A
AV
DD
REF
IN
V
P
DV
DD
MUXOUT
LE
DATA
CLK
CE
DGND
ADF4106
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
LFCSP
15 MUXOUT
14 LE
13 DATA
12 CLK
CPGND 1
AGND 2
AGND 3
20 CP
11 CE
AV DD 6
AV DD 7
REFIN 8
DGND 9
DGND 10
RFINB 4
RFINA 5
19 RSET
18 VP
17 DVDD
16 DVDD
PIN 1
INDICATOR
TOP VIEW
ADF4106
NOTE: TRANSISTOR COUNT 6425 (CMOS), 303 (BIPOLAR)
PIN FUNCTION DESCRIPTIONS
Mnemonic Function
R
SET
Connecting a resistor between this pin and CPGND sets the maximum charge pump output current. The nominal
voltage potential at the R
SET
pin is 0.6 V. The relationship between I
CP
and R
SET
is
IR
CP MAX
SET
=25 5.
So, with R
SET
= 5.1 k, I
CP MAX
= 5 mA.
CP Charge Pump Output. When enabled, this provides ±I
CP
to the external loop filter, which in turn drives the
external VCO.
CPGND Charge Pump Ground. This is the ground return path for the charge pump.
AGND Analog Ground. This is the ground return path of the prescaler.
RF
IN
BComplementary Input to the RF Prescaler. This point must be decoupled to the ground plane with a small bypass
capacitor, typically 100 pF. See Figure 3.
RF
IN
AInput to the RF Prescaler. This small signal input is ac-coupled to the external VCO.
AV
DD
Analog Power Supply. This may range from 2.7 V to 3.3 V. Decoupling capacitors to the analog ground plane
should be placed as close as possible to this pin. AV
DD
must be the same value as DV
DD
.
REF
IN
Reference Input. This is a CMOS input with a nominal threshold of V
DD
/2 and a dc equivalent input resistance of
100 k. See Figure 2. This input can be driven from a TTL or CMOS crystal oscillator, or it can be ac-coupled.
DGND Digital Ground.
CE Chip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-state
mode. Taking the pin high powers up the device, depending on the status of the power-down bit F2.
CLK Serial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched into the
24-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
DATA Serial Data Input. The serial data is loaded MSB first with the 2 LSB being the control bits. This input is a
high impedance CMOS input.
LE Load Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one of the four
latches, the latch being selected using the control bits.
MUXOUT This multiplexer output allows either the lock detect, the scaled RF, or the scaled reference frequency to be
accessed externally.
DV
DD
Digital Power Supply. This may range from 2.7 V to 3.3 V. Decoupling capacitors to the digital ground plane
should be placed as close as possible to this pin. DV
DD
must be the same value as AV
DD
.
V
P
Charge Pump Power Supply. This should be greater than or equal to V
DD
. In systems where V
DD
is 3 V, it can be
set to 5 V and used to drive a VCO with a tuning range of up to 5 V.
REV. A–6–
ADF4106–Typical Performance Characteristics
FREQ UNIT – GHz
PARAM TYPE – S
DATA FORMAT – MA
FREQ MAGS11 ANGS11
3.300 0.42777 102.748
3.400 0.42859 107.167
3.500 0.43365 111.883
3.600 0.43849 117.548
3.700 0.44475 123.856
3.800 0.44800 130.399
3.900 0.45223 136.744
4.000 0.45555 142.766
4.100 0.45313 149.269
4.200 0.45622 – 154.884
4.300 0.45555 – 159.680
4.400 0.46108 164.916
4.500 0.45325 – 168.452
4.600 0.45054 – 173.462
4.700 0.45200 – 176.697
4.800 0.45043 178.824
4.900 0.45282 174.947
5.000 0.44287 170.237
5.100 0.44909 166.617
5.200 0.44294 162.786
5.300 0.44558 158.766
5.400 0.45417 153.195
5.500 0.46038 147.721
5.600 0.47128 139.760
5.700 0.47439 132.657
5.800 0.48604 125.782
5.900 0.50637 121.110
6.000 0.52172 115.400
FREQ MAGS11 ANGS11
0.500 0.89148 – 17.2820
0.600 0.88133 20.6919
0.700 0.87152 24.5386
0.800 0.85855 – 27.3228
0.900 0.84911 – 31.0698
1.000 0.83512 34.8623
1.100 0.82374 – 38.5574
1.200 0.80871 – 41.9093
1.300 0.79176 45.6990
1.400 0.77205 – 49.4185
1.500 0.75696 – 52.8898
1.600 0.74234 – 56.2923
1.700 0.72239 60.2584
1.800 0.69419 63.1446
1.900 0.67288 65.6464
2.000 0.66227 68.0742
2.100 0.64758 71.3530
2.200 0.62454 75.5658
2.300 0.59466 79.6404
2.400 0.55932 82.8246
2.500 0.52256 85.2795
2.600 0.48754 85.6298
2.700 0.46411 86.1854
2.800 0.45776 86.4997
2.900 0.44859 88.8080
3.000 0.44588 – 91.9737
3.100 0.43810 – 95.4087
3.200 0.43269 – 99.1282
KEYWORD – R
IMPEDANCE 50
TPC 1. S-Parameter Data for the RF Input
RF INPUT FREQUENCY – GHz
0
01
–30
OUTPUT POWER – dB
246
–5
–10
–25
–20
3
–15
5
VDD = 3V
VP = 3V
TA = +85C
TA = +25C
TA = –40C
TPC 2. Input Sensitivity
FREQUENCY
0
–60
–2kHz
OUTPUT POWER – dB
–10
–50
–70
–90
–30
–40
–80
–20
2kHz900MHz–1kHz 1kHz
REF LEVEL = –14.3dBm
VDD = 3V, VP = 5V
ICP = 5mA
PFD FREQUENCY = 200kHz
LOOP BANDWIDTH = 20kHz
RES BANDWIDTH = 10Hz
VIDEO BANDWIDTH = 10Hz
SWEEP = 1.9 SECONDS
AVERAGES = 10
–93.0dBc/Hz
–100
TPC 3. Phase Noise (900 MHz, 200 kHz, and 20 kHz)
FREQUENCY OFFSET FROM 900MHz CARRIER
100Hz 1MHz
PHASE NOISE – dBc/Hz
–40
–50
–60
–70
–80
–90
–100
–110
–120
–130
10dB/DIV
RL = –40dBc/Hz
RMS NOISE = 0.36
–140
TPC 4. Integrated Phase Noise (900 MHz, 200 kHz,
and 20 kHz)
FREQUENCY
0
–60
–400kHz
OUTPUT POWER – dB
–10
–50
–70
–90
–30
–40
–80
–20
400kHz900MHz–200kHz 200kHz
REF LEVEL = –14.0dBm
V
DD
= 3V, V
P
= 5V
I
CP
= 5mA
PFD FREQUENCY = 200kHz
LOOP BANDWIDTH = 20kHz
RES BANDWIDTH = 1kHz
VIDEO BANDWIDTH = 1kHz
SWEEP = 2.5 SECONDS
AVERAGES = 30
–91.0dBc/Hz
–100
TPC 5. Reference Spurs (900 MHz, 200 kHz, and 20 kHz)
FREQUENCY
0
–60
–2kHz
OUTPUT POWER – dB
–10
–50
–70
–90
–30
–40
–80
–20
2kHz5800MHz–1kHz 1kHz
REF LEVEL = –10dBm
VDD = 3V, VP = 5V
ICP = 5mA
PFD FREQUENCY = 1MHz
LOOP BANDWIDTH = 100kHz
RES BANDWIDTH = 10Hz
VIDEO BANDWIDTH = 10Hz
SWEEP = 1.9 SECONDS
AVERAGES = 10
–84.0dBc/Hz
–100
TPC 6. Phase Noise (5.8 GHz, 1 MHz, and 100 kHz)
REV. A
ADF4106
–7–
FREQUENCY OFFSET FROM 5800MHz CARRIER
100Hz 1MHz
PHASE NOISE – dBc/Hz
–40
–50
–140
–60
–70
–80
–90
–100
–110
–120
–130
10dB/DIV
R
L
= –40dBc/Hz
RMS NOISE = 1.8
TPC 7. Integrated Phase Noise (5.8 GHz, 1 MHz,
and 100 kHz)
0
–60
–100
–2
OUTPUT POWER – dB
–1 5800 1 2
–10
–50
–70
–90
–30
–40
–80
–20
V
DD
= 3V, V
P
= 5V
I
CP
= 5mA
PDF FREQUENCY = 1MHz
LOOP BANDWIDTH = 100kHz
RES BANDWIDTH = 1kHz
VIDEO BANDWIDTH = 1kHz
SWEEP = 13 SECONDS
AVERAGES = 1
REF LEVEL = –10.0dBm
–65.0dBc
FREQUENCY – MHz
–66.0dBc
TPC 8. Reference Spurs (5.8 GHz, 1 MHz, and 100 kHz)
TEMPERATURE – C
–60
–70
–100
–40 100–20
PHASE NOISE – dBc/Hz
020406080
–80
–90
V
DD
= 3V
V
P
= 5V
TPC 9. Phase Noise (5.8 GHz, 1 MHz, and 100 kHz)
vs. Temperature
TUNING VOLTAGE – V
–5
–15
–105 051234
–45
–75
–85
–95
–25
–35
–65
–55
FIRST REFERENCE SPUR – dBc
VDD = 3V
VP = 5V
TPC 10. Reference Spurs vs. V
TUNE
(5.8 GHz,
1MHz, and 100 kHz)
PHASE DETECTOR FREQUENCY – Hz
–120
–130
–180
10k 100M100k
OUTPUT POWER – dBc/Hz
1M 10M
–140
–150
–160
–170
VDD = 3V
VP = 5V
TPC 11. Phase Noise (Referred to CP Output) vs.
PFD Frequency
PRESCALER VALUE
10
9
0
8/9 64/6516/17
AIDD – mA
32/33
4
3
2
1
6
5
8
7
TPC 12. AI
DD
vs. Prescaler Value
REV. A–8–
ADF4106
CIRCUIT DESCRIPTION
REFERENCE INPUT SECTION
The reference input stage is shown in Figure 2. SW1 and SW2
are normally closed switches. SW3 is normally open. When
power-down is initiated, SW3 is closed and SW1 and SW2 are
opened. This ensures that there is no loading of the REF
IN
pin
on power-down.
POWER-DOWN
CONTROL
100k
NC
REF
IN
NC
NO
SW1
SW2
SW3
BUFFER
TO R COUNTER
NC = NO CONNECT
Figure 2. Reference Input Stage
RF INPUT STAGE
The RF input stage is shown in Figure 3. It is followed by a
two-stage limiting amplifier to generate the CML clock levels
needed for the prescaler.
AV
DD
500
1.6V
RF
IN
A
RF
IN
B
500
AGND
BIAS
GENERATOR
Figure 3. RF Input Stage
PRESCALER OUTPUT FREQUENCY
3.5
3.0
050 300100
DI
DD
– mA
150 200 250
2.0
1.5
1.0
0.5
2.5
V
DD
= 3V
V
P
= 3V
TPC 13. DI
DD
vs. Prescaler Output Frequency
V
CP
– V
6
0
–6
0 5.00.5
I
CP
– mA
1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
4
2
–2
–4
V
P
= 5V
I
CP
= 5mA
TPC 14. Charge Pump Output Characteristics
PRESCALER (P/P + 1)
The dual-modulus prescaler (P/P + 1), along with the A and B
counters, enables the large division ratio, N, to be realized (N =
BP + A). The dual-modulus prescaler, operating at CML levels,
takes the clock from the RF input stage and divides it down to a
manageable frequency for the CMOS A and B counters. The
prescaler is programmable. It can be set in software to 8/9, 16/17,
32/33, or 64/65. It is based on a synchronous 4/5 core. There is
a minimum divide ratio possible for fully contiguous output
frequencies. This minimum is determined by P, the prescaler
value, and is given by (P
2
P).
A AND B COUNTERS
The A and B CMOS counters combine with the dual-modulus
prescaler to allow a wide ranging division ratio in the PLL feed-
back counter. The counters are specified to work when the
prescaler output is 300 MHz or less. Thus, with an RF input
frequency of 4.0 GHz, a prescaler value of 16/17 is valid but a
value of 8/9 is not.
Pulse Swallow Function
The A and B counters, in conjunction with the dual-modulus
prescaler, make it possible to generate output frequencies that
are spaced only by the reference frequency divided by R. The
equation for the VCO frequency is as follows:
fPBA
f
R
VCO
REFIN
()
+
[]
×
f
VCO
Output frequency of external voltage controlled
oscillator (VCO).
PPreset modulus of dual-modulus prescaler
(8/9, 16/17, and so on).
BPreset divide ratio of binary 13-bit counter
(3 to 8191).
APreset divide ratio of binary 6-bit swallow
counter (0 to 63).
f
REFIN
External reference frequency oscillator.
REV. A
ADF4106
–9–
PRESCALER
P/P + 1
13-BIT B
COUNTER
LOAD
LOAD
N = BP + A
FROM RF
INPUT STAGE
TO PFD
MODULUS
CONTROL
N DIVIDER
6-BIT A
COUNTER
Figure 4. A and B Counters
R COUNTER
The 14-bit R counter allows the input reference frequency to be
divided down to produce the reference clock to the phase fre-
quency detector (PFD). Division ratios from 1 to 16,383 are
allowed.
PHASE FREQUENCY DETECTOR AND CHARGE PUMP
The PFD takes inputs from the R counter and N counter (N =
BP + A) and produces an output proportional to the phase and
frequency difference between them. Figure 5 is a simplified
schematic. The PFD includes a programmable delay element
that controls the width of the antibacklash pulse. This pulse
ensures that there is no dead zone in the PFD transfer function
and minimizes phase noise and reference spurs. Two bits in the
reference counter latch, ABP2 and ABP1, control the width of
the pulse. See Table III.
HI
HI
D1
D2
Q1
Q2
CLR1
CLR2
CP
U1
U2
UP
DOWN
CHARGE
PUMP
ABP2 ABP1
CPGND
VP
R DIVIDER
N DIVIDER
R DIVIDER
N DIVIDER
CP OUTPUT
PROGRAMMABLE
DELAY U3
Figure 5. PFD Simplified Schematic and Timing (In Lock)
MUXOUT AND LOCK DETECT
The output multiplexer on the ADF4106 allows the user to access
various internal points on the chip. The state of MUXOUT is
controlled by M3, M2, and M1 in the function latch. Table V
shows the full truth table. Figure 6 shows the MUXOUT section
in block diagram form.
Lock Detect
MUXOUT can be programmed for two types of lock detect:
digital lock detect and analog lock detect.
Digital lock detect is active high. When LDP in the R counter
latch is set to 0, digital lock detect is set high when the phase
error on three consecutive phase detector cycles is less than 15 ns.
With LDP set to 1, five consecutive cycles of less than 15 ns are
required to set the lock detect. It will stay set high until a phase
error of greater than 25 ns is detected on any subsequent PD cycle.
The N-channel open-drain analog lock detect should be operated
with an external pull-up resistor of 10 k nominal. When lock
has been detected, this output will be high with narrow low-
going pulses.
ANALOG LOCK DETECT
MUXOUT
CONTROL
DIGITAL LOCK DETECT
R COUNTER OUTPUT
N COUNTER OUTPUT
SDOUT
MUX
DVDD
DGND
Figure 6. MUXOUT Circuit
INPUT SHIFT REGISTER
The ADF4106 digital section includes a 24-bit input shift register,
a 14-bit R counter, and a 19-bit N counter, comprising a 6-bit A
counter and a 13-bit B counter. Data is clocked into the 24-bit
shift register on each rising edge of CLK. The data is clocked
in MSB first. Data is transferred from the shift register to one
of four latches on the rising edge of LE. The destination latch
is determined by the state of the two control bits (C2, C1) in
the shift register. These are the two LSBs, DB1 and DB0, as
shown in the timing diagram of Figure 1. The truth table for these
bits is shown in Table VI. Table I shows a summary of how
the latches are programmed.
Table I. C2, C1 Truth Table
Control Bits
C2 C1 Data Latch
00R Counter
01N Counter (A and B)
10Function Latch (Including Prescaler)
11Initialization Latch
REV. A–10–
ADF4106
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (0) C1 (0)R1R2R3R4R5R6R7R8R9R10R11R12R13
R14
ABP1ABP2T1T2LDP
CONTROL
BITS
14-BIT REFERENCE COUNTER
TEST
MODE BITS
DB21DB22DB23
00
ANTI-
BACKLASH
WIDTH
REFERENCE COUNTER LATCH
N COUNTER LATCH
X
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (0) C1 (1)A1A2A3A4A5B1B2B3B4B5B6B7B8B9B10B11B12B13 A6
CONTROL
BITS
6-BIT A COUNTER
13-BIT B COUNTER
DB21
RESERVED
DB22DB23
CP GAIN
G1
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (1) C1 (0)F1PD1M1M2M3F3P1P2 CPI1CPI2CPI5CPI6 TC4PD2 F2
CONTROL
BITS
COUNTER
RESET
POWER-
DOWN 1
MUXOUT
CONTROL
PD
POLARITY
POWER-
DOWN 2
CURRENT
SETTING
1
PRESCALER
VALUE
TIMER COUNTER
CONTROL
CPI3CPI4
DB21
CURRENT
SETTING
2
TC3 TC2 TC1
DB22DB23
FASTLOCK
ENABLE
FASTLOCK
MODE
F4F5
FUNCTION LATCH
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (1) C1 (1)
F1PD1M1
M2M3
F3
P1P2 CPI1CPI2
CPI5
CPI6 TC4PD2 F2
CONTROL
BITS
COUNTER
RESET
POWER-
DOWN 1
MUXOUT
CONTROL
PD
POLARITY
POWER-
DOWN 2
CURRENT
SETTING
1
PRESCALER
VALUE TIMER COUNTER
CONTROL
CPI3
CPI4
DB21
CURRENT
SETTING
2
TC3 TC2 TC1
DB22DB23
FASTLOCK
ENABLE
FASTLOCK
MODE
F4
F5
INITIALIZATION LATCH
LOCK
DETECT
PRECISION
CP THREE-
STATE
CP THREE-
STATE
RESERVED
Table II. Latch Summary
REV. A
ADF4106
–11–
Table III. Reference Counter Latch Map
LDP OPERATION
0THREE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
15 ns MUST OCCUR BEFORE LOCK DETECT IS SET.
1FIVE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
15 ns MUST OCCUR BEFORE LOCK DETECT IS SET.
TEST MODE BITS
SHOULD BE SET
TO 00 FOR NORMAL
OPERATION
.
ABP2 ABP1 ANTIBACKLASH PULSEWIDTH
002.9 ns
011.3 ns
106.0 ns
112.9 ns
R14 R13 R12 .......... R3 R2 R1 DIVIDE RATIO
000.......... 0011
000.......... 0102
000.......... 0113
000.......... 1004
............. ....
............. ....
............. ....
111.......... 10016380
111.......... 10116381
111.......... 11016382
111.......... 11116383
X
= DON’T CARE
BOTH OF THESE BITS
MUST BE SET TO 0 FOR
NORMAL OPERATION
.
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (0) C1 (0)R1R2R3R4R5R6R7R8R9R10R11R12R13R14
ABP1
ABP2T1T2LDP
CONTROL
BITS
14-BIT REFERENCE COUNTER
TEST
MODE BITS
DB21DB22DB23
00
ANTI-
BACKLASH
WIDTH
X
LOCK
DETECT
PRECISION
RESERVED
REV. A–12–
ADF4106
Table IV. AB Counter Latch Map
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (0) C1 (1)
A1A2A3A4A5B1B2B3B4B5B6B7B8B9B10B11B12B13 A6
CONTROL
BITS
6-BIT A COUNTER
13-BIT B COUNTER
DB21
RESERVED
DB22DB23
CP GAIN
G1
THESE BITS ARE NOT USED
BY THE DEVICE AND ARE
DON'T CARE BITS.
F4 (FUNCTION LATCH)
FASTLOCK ENABLE CP GAIN OPERATION
00CHARGE PUMP CURRENT SETTING
1 IS PERMANENTLY USED.
01CHARGE PUMP CURRENT SETTING
2 IS PERMANENTLY USED.
10CHARGE PUMP CURRENT SETTING
1IIS PERMANENTLY USED.
11CHARGE PUMP CURRENT IS
SWITCHED TO SETTING 2. THE
TIME SPENT IN SETTING 2 IS
DEPENDENT ON WHICH FASTLOCK
MODE IS USED. SEE FUNCTION
LATCH DESCRIPTION
A COUNTER
A6 A5 .......... A2 A1 DIVIDE RATIO
00.......... 0 0 0
00.......... 0 1 1
00.......... 1 0 2
00.......... 1 1 3
............ . . .
............ . . .
............ . . .
11.......... 0 0 60
11.......... 0 1 61
11.......... 1 0 62
11.......... 1 1 63
N = BP + A; P IS PRESCALER VALUE SET IN THE FUNCTION LATCH.
B MUST BE GREATER THAN OR EQUAL TO A. FOR CONTINUOUSLY
ADJACENT VALUES OF (N FREF), AT THE OUTPUT, NMIN, IS (P
2
P).
XX
X = DON’T CARE
B13 B12 B11 B3 B2 B1 B COUNTER DIVIDE RATIO
00 0.......... 0 0 0 NOT ALLOWED
00 0.......... 0 0 1 NOT ALLOWED
00 0.......... 0 1 0 NOT ALLOWED
00 0.......... 1 1 1 3
.. ........... . . . .
.. ........... . . . .
.. ........... . . . .
11 1.......... 1 0 0 8188
11 1.......... 1 0 1 8189
11 1.......... 1 1 0 8190
11 1.......... 1 1 1 8191
REV. A
ADF4106
–13–
Table V. Function Latch Map
P2 P1 PRESCALER VALUE
008/9
0116/17
1032/33
1164/65
CE PIN PD2 PD1 MODE
0XXASYNCHRONOUS POWER-DOWN
1X0NORMAL OPERATION
101ASYNCHRONOUS POWER-DOWN
111SYNCHRONOUS POWER-DOWN
CPI6 CPI5 CPI4 ICP (mA)
CPI3 CPI2 CPI1 3 k 5.1 k11 k
0001.06 0.625 0.289
0012.12 1.25 0.580
0103.18 1.875 0.870
0114.24 2.5 1.160
1005.30 3.125 1.450
1016.36 3.75 1.730
1107.42 4.375 2.020
1118.50 5.0 2.320
TIMEOUT
TC4 TC3 TC2 TC1 (PFD CYCLES)
00003
00017
001011
001115
010019
010123
011027
011131
100035
100139
101043
101147
110051
110155
111059
111163
F4
0
1
1
M3 M2 M1
000
001
010
011DVDD
100
101
110
111
F3
0
1
F2
0
1
F1
0
1
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (1) C1 (0)
F1PD1M1
M2M3
F3
P1P2 CPI1CPI2
CPI5
CPI6 TC4PD2 F2
CONTROL
BITS
COUNTER
RESET
POWER-
DOWN 1
MUXOUT
CONTROL
PD
POLARITY
CP
THREE-
STATE
POWER-
DOWN 2
CURRENT
SETTING
1
PRESCALER
VALUE TIMER COUNTER
CONTROL
CPI3
CPI4
DB21
CURRENT
SETTING
2
TC3 TC2 TC1
DB22DB23
FASTLOCK
ENABLE
FASTLOCK
MODE
F4
F5
CHARGE PUMP
OUTPUT
NORMAL
THREE-STATE
FASTLOCK MODE
FASTLOCK DISABLED
FASTLOCK MODE 1
FASTLOCK MODE 2
COUNTER
OPERATION
NORMAL
R, A, B COUNTERS
HELD IN RESET
F5
X
0
1
OUTPUT
THREE-STATE OUTPUT
DIGITAL LOCK DETECT
(ACTIVE HIGH)
N DIVIDER OUTPUT
DVDD
R DIVIDER OUTPUT
N-CHANNEL OPEN-DRAIN
LOCK DETECT
SERIAL DATA OUTPUT
DGND
PHASE DETECTOR
POLARITY
NEGATIVE
POSITIVE
REV. A–14–
ADF4106
Table VI. Initialization Latch Map
P2 P1 PRESCALER VALUE
008/9
0116/17
1032/33
1164/65
CE PIN PD2 PD1 MODE
0XXASYNCHRONOUS POWER-DOWN
1X0NORMAL OPERATION
101ASYNCHRONOUS POWER-DOWN
111SYNCHRONOUS POWER-DOWN
CPI6 CPI5 CPI4 I
CP
(mA)
CPI3 CPI2 CPI1 3 k 5.1 k11 k
0001.06 0.625 0.289
0012.12 1.25 0.580
0103.18 1.875 0.870
0114.24 2.5 1.160
1005.30 3.125 1.450
1016.36 3.75 1.730
1107.42 4.375 2.020
1118.50 5.0 2.320
TIMEOUT
TC4 TC3 TC2 TC1 (PFD CYCLES)
00003
00017
001011
001115
010019
010123
011027
011131
100035
100139
101043
101147
110051
110155
111059
111163
F4
0
1
1
M3 M2 M1
000
001
010
011DVDD
100
101
110
111
F3
0
1
F2
0
1
F1
0
1
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
C2 (1) C1 (1)
F1PD1M1
M2M3
F3
P1P2 CPI1CPI2
CPI5
CPI6 TC4PD2 F2
CONTROL
BITS
COUNTER
RESET
POWER-
DOWN 1
MUXOUT
CONTROL
PD
POLARITY
CP
THREE-
STATE
POWER-
DOWN 2
CURRENT
SETTING
1
PRESCALER
VALUE TIMER COUNTER
CONTROL
CPI3
CPI4
DB21
CURRENT
SETTING
2
TC3 TC2 TC1
DB22DB23
FASTLOCK
ENABLE
FASTLOCK
MODE
F4
F5
CHARGE PUMP
OUTPUT
NORMAL
THREE-STATE
FASTLOCK MODE
FASTLOCK DISABLED
FASTLOCK MODE 1
FASTLOCK MODE 2
COUNTER
OPERATION
NORMAL
R, A, B COUNTERS
HELD IN RESET
F5
X
0
1
OUTPUT
THREE-STATE OUTPUT
DIGITAL LOCK DETECT
(ACTIVE HIGH)
N DIVIDER OUTPUT
DV
DD
R DIVIDER OUTPUT
N-CHANNEL OPEN-DRAIN
LOCK DETECT
SERIAL DATA OUTPUT
DGND
PHASE DETECTOR
POLARITY
NEGATIVE
POSITIVE
REV. A
ADF4106
–15–
FUNCTION LATCH
With C2, C1 set to 1, 0, the on-chip function latch will be
programmed. Table V shows the input data format for program-
ming the function latch.
Counter Reset
DB2 (F1) is the counter reset bit. When this is 1, the R counter
and the A, B counters are reset. For normal operation, this bit
should be 0. Upon power-up, the F1 bit needs to be disabled (set to 0).
The N counter then resumes counting in close alignment with the R
counter. (The maximum error is one prescaler cycle.)
Power-Down
DB3 (PD1) and DB21 (PD2) on the ADF4106 provide program-
mable power-down modes. They are enabled by the CE pin. When
the CE pin is low, the device is immediately disabled regardless of
the states of PD2, PD1. In the programmed asynchronous power-
down, the device powers down immediately after latching a 1 into
bit PD1, with the condition that PD2 has been loaded with a 0. In
the programmed synchronous power-down, the device power-
down is gated by the charge pump to prevent unwanted frequency
jumps. Once the power-down is enabled by writing a 1 into bit
PD1 (on condition that a 1 has also been loaded to PD2), the
device will go into power-down on the occurrence of the next
charge pump event. When a power-down is activated (either
synchronous or asynchronous mode including CE pin-activated
power-down), the following events occur:
All active dc current paths are removed.
The R, N, and timeout counters are forced to their load
state conditions.
The charge pump is forced into three-state mode.
The digital lock detect circuitry is reset.
The RF
IN
input is debiased.
The reference input buffer circuitry is disabled.
The input register remains active and capable of loading
and latching data.
MUXOUT Control
The on-chip multiplexer is controlled by M3, M2, and M1 on
the ADF4106. Table V shows the truth table.
Fastlock Enable Bit
DB9 of the function latch is the fastlock enable bit. Only when
this is 1 is fastlock enabled.
Fastlock Mode Bit
DB10 of the function latch is the fastlock mode bit. When fastlock
is enabled, this bit determines which fastlock mode is used. If
the fastlock mode bit is 0, Fastlock Mode 1 is selected, and if
the fastlock mode bit is 1, Fastlock Mode 2 is selected.
Fastlock Mode 1
The charge pump current is switched to the contents of Current
Setting 2. The device enters fastlock by having a 1 written to the
CP gain bit in the AB counter latch. The device exits fastlock by
having a 0 written to the CP gain bit in the AB counter latch.
Fastlock Mode 2
The charge pump current is switched to the contents of Current
Setting 2. The device enters fastlock by having a 1 written to the
CP gain bit in the AB counter latch. The device exits fastlock
under the control of the timer counter. After the timeout period
determined by the value in TC4 through TC1, the CP gain bit in
the AB counter latch is automatically reset to 0 and the device
reverts to normal mode instead of fastlock. See Table V for the
timeout periods.
Timer Counter Control
The user has the option of programming two charge pump
currents. The intent is that the Current Setting 1 is used when the
RF output is stable and the system is in a static state. Current
Setting 2 is meant to be used when the system is dynamic and in a
state of change (e.g., when a new output frequency is pro-
grammed). The normal sequence of events is as follows.
Users initially decide what the preferred charge pump currents
will be. For example, they may choose 2.5 mA as Current
Setting 1 and 5 mA as Current Setting 2. At the same time, they
must also decide how long they want the secondary current to stay
active before reverting to the primary current. This is controlled
by the timer counter control bits DB14 to DB11 (TC4 through
TC1) in the function latch. The truth table is provided in Table V.
When users want to program a new output frequency, they can
simply program the AB counter latch with new values for A and B.
At the same time, they can set the CP gain bit to a 1, which sets
the charge pump with the value in CPI6 through CPI4 for a period
of time determined by TC4 through TC1. When this time is up,
the charge pump current reverts to the value set by CPI3 through
CPI1. At the same time, the CP Gain bit in the AB counter latch
is reset to 0 and is ready for the next time the user wants to change
the frequency.
Note that there is an enable feature on the timer counter. It is
enabled when Fastlock Mode 2 is chosen when the fastlock mode
bit (DB10) in the function latch is set to 1.
Charge Pump Currents
CPI3, CPI2, and CPI1 program Current Setting 1 for the charge
pump. CPI6, CPI5, and CPI4 program Current Setting 2 for the
charge pump. The truth table is in Table V.
Prescaler Value
P2 and P1 in the function latch set the prescaler values. The
prescaler value should be chosen so that the prescaler output
frequency is always less than or equal to 300 MHz. Thus, with
an RF frequency of 4 GHz, a prescaler value of 16/17 is valid,
but a value of 8/9 is not.
PD Polarity
This bit sets the phase detector polarity bit. See Table V.
CP Three-State
This bit controls the CP output pin. With the bit set high, the
CP output is put into three-state. With the bit set low, the CP
output is enabled.
REV. A–16–
ADF4106
INITIALIZATION LATCH
When C2, C1 = 1, 1, the initialization latch is programmed. This is
essentially the same as the function latch (programmed when C2,
C1 = 1, 0).
However, when the initialization latch is programmed, there is
an additional internal reset pulse applied to the R and AB
counters. This pulse ensures that the AB counter is at the load
point when the AB counter data is latched, and the device will
begin counting in close phase alignment.
If the latch is programmed for synchronous power-down (CE
pin is high; PD1 bit is high; PD2 bit is low), the internal pulse
also triggers this power-down. The prescaler reference and the
oscillator input buffer are unaffected by the internal reset pulse,
so close phase alignment is maintained when counting resumes.
When the first AB counter data is latched after initialization, the
internal reset pulse is again activated. However, subsequent AB
counter loads will not trigger the internal reset pulse.
DEVICE PROGRAMMING AFTER INITIAL POWER-UP
After the device is initially powered up, there are three ways to
program it.
Initialization Latch Method
Apply V
DD
.
Program the initialization latch (11 in 2 LSB of input
word). Make sure that F1 bit is programmed to 0.
Do a function latch load (10 in 2 LSB of the control
word), making sure that the F1 bit is programmed to a 0.
Do an R load (00 in 2 LSB).
Do an AB load (01 in 2 LSB).
When the initialization latch is loaded, the following occurs:
1. The function latch contents are loaded.
2. An internal pulse resets the R, A, B, and timeout counters
to load state conditions and three-states the charge pump.
Note that the prescaler band gap reference and the oscilla-
tor input buffer are unaffected by the internal reset pulse,
allowing close phase alignment when counting resumes.
3. Latching the first AB counter data after the initialization
word will activate the same internal reset pulse. Successive
AB loads will not trigger the internal reset pulse unless
there is another initialization.
CE Pin Method
Apply V
DD
.
Bring CE low to put the device into power-down. This is an
asynchronous power-down (it happens immediately).
Program the function latch (10).
Program the R counter latch (00).
Program the AB counter latch (01).
Bring CE high to take the device out of power-down.
The R and AB counters will then resume counting in close
alignment. Note that after CE goes high, a duration of 1 µs may
be required for the prescaler band gap voltage and oscillator
input buffer bias to reach steady state.
CE can be used to power the device up and down to check for
channel activity. The input register does not need to be repro-
grammed each time the device is disabled and enabled as long as it
has been programmed at least once after V
DD
was initially applied.
Counter Reset Method
Apply V
DD
.
Do a function latch load (10 in 2 LSB). As part of
this, load 1 to the F1 bit. This enables the counter reset.
Do an R counter load (00 in 2 LSB).
Do an AB counter load (01 in 2 LSB).
Do a function latch load (10 in 2 LSB). As part of
this, load 0 to the F1 bit. This disables the counter reset.
This sequence provides the same close alignment as the initial-
ization method. It offers direct control over the internal reset.
Note that counter reset holds the counters at load point and
three-states the charge pump but does not trigger synchronous
power-down.
APPLICATION
Local Oscillator for LMDS Base Station Transmitter
Figure 7 shows the ADF4106 being used with a VCO to pro-
duce the LO for an LMDS base station operation in the
5.4 GHz to 5.8 GHz band.
The reference input signal is applied to the circuit at FREF
IN
and, in this case, is terminated in 50 . A typical base station
system would have either a TCXO or an OCXO driving the
reference input without any 50 termination.
To have a channel spacing of 1 MHz at the output, the 10 MHz
reference input must be divided by 10, using the on-chip refer-
ence divider of the ADF4106.
The charge pump output of the ADF4106 (Pin 2) drives the
loop filter. In calculating the loop filter component values, a
number of items need to be considered. In this example, the
loop filter was designed so that the overall phase margin for the
system would be 45 degrees. Other PLL system specifications
are given below:
K
D
= 2.5 mA
K
V
= 80 MHz/V
Loop Bandwidth = 50 kHz
F
REF
= 1 MHz
N = 5800
Extra Reference Spur Attenuation = 10 dB
All of these specifications are needed and used to come up with
the loop filter component values shown in Figure 7.
Figure 7 gives a typical phase noise performance of 83 dBc/Hz
at 1 kHz offset from the carrier. Spurs are better than 62 dBc.
The loop filter output drives the VCO, which, in turn, is fed
back to the RF input of the PLL synthesizer. It also drives the
RF output terminal. A T-circuit configuration provides 50
matching between the VCO output, the RF output, and the
RF
IN
terminal of the synthesizer. Note that the ADF4106 RF
input looks like 50 at 5.8 GHz, so no terminating resistor is
needed. When operating at lower frequencies, however, this is
not the case.
In a PLL system, it is important to know when the system is
locked. In Figure 7, this is accomplished by using the MUXOUT
signal from the synthesizer. The MUXOUT pin can be pro-
grammed to monitor various internal signals in the synthesizer.
One of these is the LD or (lock detect) signal.
REV. A
ADF4106
–17–
Figure 7. Local Oscillator for LMDS Station
INTERFACING
The ADF4106 has a simple SPI
®
compatible serial interface for
writing to the device. CLK, DATA, and LE control the data
transfer. When LE (latch enable) goes high, the 24 bits that
have been clocked into the input register on each rising edge of
SCLK get transferred to the appropriate latch. See Figure 1 for
the timing diagram and Table I for the latch truth table.
The maximum allowable serial clock rate is 20 MHz. This
means that the maximum update rate possible for the device is
833 kHz or one update every 1.2 µs. This is certainly more than
adequate for systems that have typical lock times in hundreds of
microseconds.
ADuC812 Interface
Figure 8 shows the interface between the ADF4106 and the
ADuC812 MicroConverter
®
. Since the ADuC812 is based on
an 8051 core, this interface can be used with any 8051 based
microcontroller. The MicroConverter is set up for SPI master
mode with CPHA = 0. To initiate the operation, the I/O port
driving LE is brought low. Each latch of the ADF4106 needs a
24-bit word. This is accomplished by writing three 8-bit bytes
from the MicroConverter to the device. When the third byte has
been written, the LE input should be brought high to complete
the transfer.
On first application of power to the ADF4106, three writes are
needed (one to the R counter latch, one to the N counter latch,
and one to the function latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control
power-down (CE input) and to detect lock (MUXOUT config-
ured as lock detect and polled by the port input).
When operating in the mode described, the maximum SCLOCK
rate of the ADuC812 is 4 MHz. This means that the maximum
rate at which the output frequency can be changed is 166 kHz.
ADuC812 ADF4106
CLK
DATA
LE
CE
MUXOUT
(LOCK DETECT)
SCLOCK
MOSI
I/O PORTS
Figure 8. ADuC812 to ADF4106 Interface
ADF4106
V940ME03
FREF
IN
RF
OUT
V
DD
V
P
V
CC
CE
CLK
DATA
LE
SPI COMPATIBLE SERIAL BUS
1000pF 1000pF
REF
IN
NOTE
DECOUPLING CAPACITORS (0.1
F/10pF) ON AV
DD
, DV
DD
,
V
P
OF THE ADF4106 AND ON V
CC
OF THE V940ME03 HAVE
BEEN OMITTED FROM THE DIAGRAM TO AID
CLARITY.
100pF
AV
DD
DV
DD
VP
CP
MUXOUT LOCK
DETECT
RF
IN
A
RF
IN
B
CPGND
AGND
DGND
100pF
1.5nF
20pF
100pF
100pF
1, 3, 4, 5, 7, 8,
9, 11, 12, 13
R
SET
5.1k
51
6.2k
4.3k
100pF
18
18
18
REV. A–18–
ADF4106
ADSP-2181 Interface
Figure 9 shows the interface between the ADF4106 and the
ADSP-21xx digital signal processor. The ADF4106 needs a 24-bit
serial word for each latch write. The easiest way to accomplish
this using the ADSP-21xx family is to use the autobuffered
transmit mode of operation with alternate framing. This provides
a means for transmitting an entire block of serial data before an
interrupt is generated. Set up the word length for eight bits and use
three memory locations for each 24-bit word. To program each
24-bit latch, store the three 8-bit bytes, enable the autobuffered
mode, and then write to the transmit register of the DSP. This
last operation initiates the autobuffer transfer.
ADSP-21xx ADF4106
CLK
DATA
LE
CE
MUXOUT
(LOCK DETECT)
SCLOCK
MOSI
I/O FLAGS
TFS
Figure 9. ADSP-21xx to ADF4106 Interface
REV. A
ADF4106
–19–
OUTLINE DIMENSIONS
16-Lead Thin Shrink Small Outline Package [TSSOP]
(RU-16)
Dimensions shown in millimeters
16 9
81
PIN 1
SEATING
PLANE
8
0
4.50
4.40
4.30
6.40
BSC
5.10
5.00
4.90
0.65
BSC
0.15
0.05
1.20
MAX
0.20
0.09 0.75
0.60
0.45
0.30
0.19
COPLANARITY
0.10
COMPLIANT TO JEDEC STANDARDS MS-153AB
20-Lead Lead Frame Chip Scale Package [LFCSP]
(CP-20)
Dimensions shown in millimeters
1
20
5
6
11
16
15
BOTTOM
VIEW
10
2.25
2.10 SQ
1.95
0.75
0.55
0.35
0.30
0.23
0.18
0.50
BSC
12MAX
0.20
REF
0.80 MAX
0.65 NOM
0.05
0.02
0.00
1.00
0.90
0.80
SEATING
PLANE
PIN 1
INDICATOR
TOP
VIEW
3.75
BSC SQ
4.0
BSC SQ
COPLANARITY
0.08
COMPLIANT TO JEDEC STANDARDS MO-220-VGGD-1
0.60
MAX
0.60
MAX
REV. A
C02720–0–5/03(A)
–20–
ADF4106
Revision History
Location Page
5/03—Data Sheet changed from REV. 0 to REV. A.
Edits to SPECIFICATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Edits to TPC 11 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Update OUTLINE DIMENSIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19