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1. General description
The HEF4066B provides four single-pole, single-throw analog switch functions. Each
switch has two input/output terminals (nY and nZ) and an active HIGH enable input (nE).
When nE is LOW, the analog switch is turned off.
The HEF4066B is pin compatible with the HEF4016B but exhibits a much lower ON
resistance. In addition the ON resistance is relatively constant over the full inpu t signal
range.
2. Features and benefits
Fully static operation
5 V, 10 V, and 15 V parametric ratings
Standardized symmetrical output characteristics
Inputs and outputs are protected against electrostatic effects
Specified from 40 C to +85 C and 40 C to +125 C
Complies with JEDEC standard JESD 13-B
3. Applications
Analog multiplexing and demultiplexing
Digital multiplexing and demultiplexing
Signal gating
4. Ordering information
HEF4066B
Quad single-pole single-throw analog switch
Rev. 9 — 19 April 2016 Product data sheet
Table 1. Ordering information
Type number Package
Temperature range Name Description Version
HEF4066BT 40 C to +125 C SO14 plastic small outline package; 14 leads;
body width 3.9 mm SOT108-1
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 2 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
5. Functional diagram
6. Pinning information
6.1 Pinning
6.2 Pin description
Fig 1. Functional di ag ram Fig 2. Logic diagram (one swi tch)
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Table 2. Pin description
Symbol Pin Description
1Y, 2Y, 3Y, 4Y 1, 4, 8, 11 independent input or output
1Z, 2Z, 3Z, 4Z 2, 3, 9, 10 independent input or output
1E, 2E, 3E, 4E 13, 5, 6, 12 enable input (active HIGH)
VSS 7 ground (0 V)
VDD 14 supply voltage
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 3 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
7. Functional description
[1] H = HIGH voltage level; L = LOW voltage level.
8. Limiting values
[1] To avoid drawing VDD current out of terminal nZ, when switch current flows into terminals nY, the voltage drop across the bidirectional
switch must not exceed 0.4 V. If the switch current flows into terminal nZ, no VDD current will flow out of terminals nY, in this case there
is no limit for the voltage drop across the switch, but the voltages at nY and nZ may not exceed VDD or VSS.
[2] For SO14 packages: above Tamb = 70 C, Ptot derates linearly with 8 mW/K.
9. Recommended operating conditions
Table 3. Function table[1]
Input nE Switch
HON
LOFF
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to VSS = 0 V (ground).
Symbol Parameter Conditions Min Max Unit
VDD supply voltage 0.5 +18 V
IIK input clamping current VI<0.5 V or VI>V
DD + 0.5 V - 10 mA
VIinput voltage 0.5 VDD + 0.5 V
II/O input/output current [1] -10 mA
Tstg storage temperature 65 +150 C
Tamb ambient temperature 40 +125 C
Ptot total power dissipation Tamb = 40 C to +125 C
SO14 [2] -500mW
P power dissipation per switch - 100 mW
Table 5. Recommended operating con ditions
Symbol Parameter Conditions Min Typ Max Unit
VDD supply voltage 3 - 15 V
VIinput voltage 0 - VDD V
Tamb ambient temperature in free air 40 - +125 C
t/V input transition rise and fall
rate VDD = 5 V - - 3.75 s/V
VDD = 10 V - - 0.5 s/V
VDD = 15 V - - 0.08 s/V
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 4 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
10. Static characteristics
10.1 Test circuit
Table 6. Static characteristics
VSS = 0 V; VI = VSS or VDD unless otherwise specified.
Symbol Parameter Conditions VDD Tamb = 40 C Tamb = 25 C Tamb = 85 C Tamb = 125 CUnit
Min Max Min Max Min Max Min Max
VIH HIGH-level
input voltage IO < 1 A 5 V 3.5 - 3.5 - 3.5 - 3.5 - V
10 V 7.0 - 7.0 - 7.0 - 7.0 - V
15 V 11.0 - 11.0 - 11.0 - 11.0 - V
VIL LOW-level
input voltage IO < 1 A 5 V - 1.5 - 1.5 - 1.5 - 1.5 V
10 V - 3.0 - 3.0 - 3.0 - 3.0 V
15 V - 4.0 - 4.0 - 4.0 - 4.0 V
IIinput leakage
current 15 V - 0.1 - 0.1 - 1.0 - 1.0 A
IS(OFF) OFF-state
leakage
current
per channel;
see Figure 4 15 V - - - 200 - - - - nA
IDD supply current all valid input
combinations 5 V - 1.0 - 1.0 - 7.5 - 7.5 A
10 V - 2.0 - 2.0 - 15.0 - 15.0 A
15 V - 4.0 - 4.0 - 30.0 - 30.0 A
CIinput
capacitance nE input - - - - 7.5 - - - - pF
Fig 4. Test circuit for measuring OFF-state leakage current
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HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 5 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
10.2 ON resistance
10.2.1 ON resistance waveform and test circuit
Table 7. ON resistance
Tamb = 25
C; ISW =200
A; VSS = 0 V.
Symbol Parameter Conditions VDD Typ Max Unit
RON(peak) ON resistance (peak) VI = 0 V to VDD; see Figure 5 and
Figure 6 5 V 350 2500
10 V 80 245
15 V 60 175
RON(rail) ON resistance (rail) VI = 0 V; see Figure 5 and Figure 6 5 V 115 340
10 V 50 160
15 V 40 115
VI = VDD; see Figure 5 and Figure 6 5 V 120 365
10 V 65 200
15 V 50 155
RON ON resistance mismatch
between channel s VI = 0 V to VDD; see Figure 5 5V 25 -
10 V 10 -
15 V 5 -
RON =V
SW /I
SW.I
SW = 200 A.
(1) VDD = 5 V
(2) VDD = 10 V
(3) VDD = 15 V
Fig 5. Test circuit for measuring RON Fig 6. Typical RON as a function of input voltage
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HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 6 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
11. Dynamic characteristics
Table 8. Dynamic characteristics
Tamb = 25
C; VSS = 0 V; for test circuit see Figure 9.
Symbol Parameter Conditions VDD Typ Max Unit
tPHL HIGH to LOW propagation delay nY, nZ to nZ, nY; see Figure 7 5 V 10 20 ns
10 V 5 10 ns
15 V 5 10 ns
nY, nZ to nZ, nY; see Figure 7 5 V 10 20 ns
10 V 5 10 ns
15 V 5 10 ns
tPHZ HIGH to OFF-state
propagation delay nE to nY, nZ; see Figure 8 5 V 80 160 ns
10 V 65 130 ns
15 V 60 120 ns
tPZH OFF-state to HIGH
propagation delay nE to nY, nZ; see Figure 8 5 V 40 80 ns
10 V 20 40 ns
15 V 15 30 ns
tPLZ LOW to OFF-state
propagation delay nE to nY, nZ; see Figure 8 5 V 80 160 ns
10 V 70 140 ns
15 V 70 140 ns
tPZL OFF-state to LOW
propagation delay nE to nY, nZ; see Figure 8 5 V 45 90 ns
10 V 20 40 ns
15 V 15 30 ns
Table 9. Dynamic power dissipation PD
PD can be calculated from the formulas shown; VSS = 0 V; tr = tf
20 ns; Tamb = 25
C.
Symbol Parameter VDD Typical formula for PD (W) where:
PDdynamic power
dissipation 5V P
D = 2500 fi + (fo CL) VDD2fi = input frequency in MHz;
fo = output frequency in MHz;
CL = output load capacitance in pF;
VDD = supply voltage in V;
(CL fo) = sum of the outputs.
10 V PD = 11500 fi + (fo CL) VDD2
15 V PD = 29000 fi + (fo CL) VDD2
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 7 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
11.1 W aveforms and test circuit
Measurement points are given in Table 10.
Fig 7. nY or nZ to nZ or nY propagation delays
Measurement points are given in Table 10.
Fig 8. Enable and disable times
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Supply voltage Input Output
VDD VMVM
5 V to 15 V 0.5VDD 0.5VDD
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 8 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
11.2 Additional dynamic parameters
Test data is given in Table 11.
Definitions:
DUT = Device Under Test.
RT= Termination resistance should be equal to output impedance Zo of the pulse generator.
CL= Load capacitance including test jig and probe.
RL= Load resistance.
Fig 9. Test circuit for measuring switching times
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Supply voltage Input Load S1 position
VDD VItr, tfCLRLtPHL, tPLH tPZH, tPHZ tPZL, tPLZ
5 V to 15 V 0 V or VDD 20 ns 50 pF 10 kVSS VSS VDD
Table 12. Additional dynamic characte ristics
VSS = 0 V; Tamb = 25
C.
Symbol Parameter Conditions VDD Typ Max Unit
THD total harmonic distortion see Figure 10; RL=10k; CL=15pF;
channel ON; VI=0.5V
DD (p-p);
fi=1kHz
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Vct crosstalk voltage nE input to switch; see Figure 11;
RL= 10 k; CL=15pF;
nE = VDD (square-wave)
10 V 50 - mV
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 9 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
[1] fi is biased at 0.5VDD.
11.2.1 Test circuits
Xtalk crosstalk between switches; see Figure 12;
fi= 1 MHz; RL=1 k;
VI=0.5V
DD (p-p)
10 V [1] 50 - dB
iso isolation (OFF-state) see Figure 13; fi= 1 MHz; RL = 1 k;
CL = 5 pF; VI=0.5V
DD (p-p) 10 V [1] 50 - dB
f(3dB) 3 dB frequency response see Figure 14; RL = 1 k; CL = 5 pF;
VI=0.5V
DD (p-p) 10 V [1] 90 - MHz
Table 12. Additional dynamic characte ristics …continued
VSS = 0 V; Tamb = 25
C.
Symbol Parameter Conditions VDD Typ Max Unit
Fig 10. Test circuit for measuring total harmonic distortion
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Fig 11. Test circuit for measuring crosstalk voltage between digital input and switch
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HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 10 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
20 log10 (VO2 / VO1) or 20 log10 (VO1 / VO2).
Fig 12. Test circuit for measuring crosstalk between switches
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Fig 13. Test circuit for measuring isolation (OFF-state) Fig 14. Test circuit for measuring frequency response
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HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 11 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
12. Package outline
Fig 15. Package outline SOT108-1 (SO14)
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HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 12 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
13. Abbreviations
14. Revision history
Table 13. Abbreviations
Acronym Description
DUT Device Under Test
Table 14. Revision history
Document ID Release date Data sheet status Change notice Supersedes
HEF4066B v.10 20160419 Product data sheet - HEF4066B v.9
Modifications: Table 4: Condition for total power dissipation changed (errata)
Table 4: Maximum ambient temperature changed (errata)
HEF4066B v.9 20151216 Product data sheet - HEF4066B v.8
Modifications: Type number HEF4066BP (SOT27-1) removed.
HEF4066B v.8 20140911 Product data sheet - HEF4066B v.7
Modifications: Figure 11: Test circuit modified
HEF4066B v.7 20111116 Product data sheet - HEF4066B v.6
Modifications: Legal pages updated.
Changes in “General description”, “Features and benefits” and “Applications”.
HEF4066B v.6 20100325 Product data sheet - HEF4066B v.5
HEF4066B v.5 20100225 Product data sheet - HEF4066B v.4
HEF4066B v.4 20091013 Product data sheet - HEF4066B_CNV v.3
HEF4066B_CNV v.3 19950101 Product specification - HEF4066B_CNV v.2
HEF4066B_CNV v.2 19950101 Product specification - -
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 13 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
15. Legal information
15.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of de vice(s) descr ibed in th is document m ay have cha nged since thi s document w as publish ed and may di ffe r in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not b e relied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semicond uctors sales
office. In case of any inconsistency or conflict wit h the short data sheet, the
full data sheet shall pre va il.
Product specificat io n — The information and data provided in a Product
data sheet shall define the specification of the product as agr eed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to off er functions and qualities beyond those described in the
Product data sheet.
15.3 Disclaimers
Limited warr a nty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warrant ies, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information. NXP Se miconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
In no event shall NXP Semiconductors be liable for any indirect , incidental,
punitive, special or consequ ential damages (including - wit hout limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ ag gregate and cumulative l iability toward s
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, lif e-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in perso nal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconducto rs products in such equipment or
applications and ther efore such inclu sion and/or use is at the cu stomer’s own
risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and ope ration of their applications
and products using NXP Semiconductors product s, and NXP Semiconductors
accepts no liability for any assistance with applicati ons or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suit able and fit for t he customer’s applications and
products planned, as well as fo r the planned application and use of
customer’s third party customer(s). Custo mers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party custo mer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individua l agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing i n this document may be interpreted or
construed as an of fer t o sell product s that is open for accept ance or the gr ant,
conveyance or implication of any license under any copyrights, patents or
other industrial or inte llectual property rights.
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contain s data from the objective specification for product develop ment.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the product specification.
HEF4066B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 9 — 19 April 2016 14 of 15
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It i s neither qua lif ied nor test ed
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in au tomotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automot ive specifications and standards, custome r
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such au tomotive applications, use and specificatio ns, and (b)
whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconduct ors for an y
liability, damages or failed produ ct claims result ing from custome r design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specificat ions.
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
15.4 Trademarks
Notice: All referenced b rands, produc t names, service names and trademarks
are the property of their respective ow ners.
16. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to : salesaddresses@nxp.com
NXP Semiconductors HEF4066B
Quad single-pole single-throw analog switch
© NXP Semiconductors N.V. 2016. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 19 April 2016
Document identifier: HEF4066B
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
17. Contents
1 General description. . . . . . . . . . . . . . . . . . . . . . 1
2 Features and benefits . . . . . . . . . . . . . . . . . . . . 1
3 Applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
4 Ordering information. . . . . . . . . . . . . . . . . . . . . 1
5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
6 Pinning information. . . . . . . . . . . . . . . . . . . . . . 2
6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 2
7 Functional description . . . . . . . . . . . . . . . . . . . 3
8 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3
9 Recommended operating conditions. . . . . . . . 3
10 Static characteristics. . . . . . . . . . . . . . . . . . . . . 4
10.1 Test circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
10.2 ON resistance. . . . . . . . . . . . . . . . . . . . . . . . . . 5
10.2.1 ON resistance waveform and test circuit . . . . . 5
11 Dynamic characteristics . . . . . . . . . . . . . . . . . . 6
11.1 Waveforms and test circuit . . . . . . . . . . . . . . . . 7
11.2 Additional dynamic parameters . . . . . . . . . . . . 8
11.2.1 Test circuits. . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
12 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 11
13 Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 12
14 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 12
15 Legal information. . . . . . . . . . . . . . . . . . . . . . . 13
15.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 13
15.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
15.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 13
15.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
16 Contact information. . . . . . . . . . . . . . . . . . . . . 14
17 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15