2Electrical characteristics
(TCASE = 25 °C unless otherwise specified)
Table 3. On/off states
Symbol Parameter Test conditions Min. Typ. Max. Unit
V(BR)DSS Drain-source breakdown voltage VGS = 0 V, ID = 1 mA 1200 V
IDSS Zero gate voltage drain current
VGS = 0 V, VDS = 1200 V 1 µA
VGS = 0 V, VDS = 1200 V,
Tc = 125 °C(1) 100 µA
IGSS Gate body leakage current VDS = 0 V, VGS = ± 20 V ±5 µA
VGS(th) Gate threshold voltage VDS = VGS, ID = 100 µA 3 4 5 V
RDS(on) Static drain-source on- resistance VGS = 10 V, ID= 6 A 630 690 mΩ
1. Defined by design, not subject to production test.
Table 4. Dynamic
Symbol Parameter Test conditions Min. Typ. Max. Unit
Ciss Input capacitance
VGS = 0 V, VDS = 100 V,
f = 1 MHz
- 1360 - pF
Coss Output capacitance - 105 - pF
Crss Reverse transfer capacitance - 0.9 - pF
Co(tr)(1) Time-related equivalent
capacitance VGS = 0 V, VDS = 0 to 960 V
- 118 - pF
Co(er)(2) Energy-related equivalent
capacitance - 42 - pF
RGIntrinsic gate resistance f = 1 MHz, ID = 0 A - 3.2 - Ω
QgTotal gate charge VDD = 960 V, ID = 12 A
VGS = 0 to 10 V
(see Figure 14. Test circuit for gate
charge behavior)
- 41.1 - nC
Qgs Gate-source charge - 9.9 - nC
Qgd Gate-drain charge - 25.2 - nC
1. Time-related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases
from 0 to 80% VDSS.
2. Energy-related is defined as a constant equivalent capacitance giving the same stored energy as Coss when VDS increases
from 0 to 80% VDSS .
Table 5. Switching times
Symbol Parameter Test conditions Min. Typ. Max. Unit
td(on) Turn-on delay time VDD = 600 V, ID = 6 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 13. Test circuit for
resistive load switching times and
Figure 18. Switching time
waveform)
- 17.5 - ns
trRise time - 9 - ns
td(off) Turn-off delay time - 56 - ns
tfFall time - 22 - ns
STH13N120K5-2AG
Electrical characteristics
DS12917 - Rev 2 page 3/15