SQ2398ES
www.vishay.com Vishay Siliconix
S15-1777-Rev. A, 30-Jul-15 2Document Number: 67117
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Notes
a. Pulse test; pulse width 300 μs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
SPECIFICATIONS (TC = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-Source Breakdown Voltage VDS VGS = 0 V, ID = 250 μA 100 - - V
Gate-Source Threshold Voltage VGS(th) VDS = VGS, ID = 250 μA 2.5 3.0 3.5
Gate-Source Leakage IGSS V
DS = 0 V, VGS = ± 20 V - - ± 100 nA
Zero Gate Voltage Drain Current IDSS
VGS = 0 V VDS = 100 V - - 1
μA VGS = 0 V VDS = 100 V, TJ = 125 °C - - 50
VGS = 0 V VDS = 100 V, TJ = 175 °C - - 150
On-State Drain Current a I
D(on) V
GS = 10 V VDS 5 V 5 - - A
Drain-Source On-State Resistance a R
DS(on)
VGS = 10 V ID = 1.5 A - 0.240 0.300
VGS = 10 V ID = 1.5 A, TJ = 125 °C - - 0.552
VGS = 10 V ID = 1.5 A, TJ = 175 °C - - 0.720
Forward Transconductance b gfs VDS = 15 V, ID = 1.5 A - 3 - S
Dynamic b
Input Capacitance Ciss
VGS = 0 V VDS = 50 V, f = 1 MHz
- 152 -
pF Output Capacitance Coss -28-
Reverse Transfer Capacitance Crss -12-
Total Gate Charge c Qg
VGS = 10 V VDS = 50 V, ID = 1.5 A
-2.33.4
nC Gate-Source Charge c Qgs -0.7-
Gate-Drain Charge c Qgd -1.1-
Gate Resistance Rg f = 1 MHz 2.9 5.8 8.7
Turn-On Delay Time c td(on)
VDD = 50 V, RL = 33
ID 1.5 A, VGEN = 10 V, Rg = 1
-56.9
ns
Rise Time c tr -1824
Turn-Off Delay Time c td(off) -79
Fall Time c tf -1723
Source-Drain Diode Ratings and Characteristics b
Pulsed Current a ISM --8A
Forward Voltage VSD IF = 1.5 A, VGS = 0 V - 0.8 1.2 V